Technique allows precision X-ray photoelectron spectroscopy of insulators as well as improved results with metals and semiconductors.


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    Title :

    ESCA measurement of insulator surfaces


    Contributors:

    Published in:

    Publication date :

    1977-06-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English


    Keywords :



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