This paper describes the environmental models of the radiation belts and computational techniques which have been developed for predicting the radiation hazards for spacecraft. These data and techniques are then applied to the Atmosphere Explorer 51 spacecraft to explain its successful survival for more than 18 months in a severe environment. In particular, the results of the analysis are used to explain the performance of some 2400 CMOS devices, and consequently, they demonstrate the reliability of this device technology in spacecraft systems.


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    Title :

    Successful large-scale use of CMOS devices on spacecraft traveling through intense radiation belts


    Contributors:


    Publication date :

    1976-01-01


    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English




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