Thin layers of contaminant on metal surface are detected by measuring surface-potential difference between reference electrode and surface of interest. Procedure does not require mechanical contact with surface under examination.


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    Title :

    Detecting contamination on a metal surface


    Contributors:
    Harris, J. M. (author) / Marcus, H. L. (author) / Smith, T. (author)

    Published in:

    Publication date :

    1977-03-01



    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English


    Keywords :



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