Selected Apollo 16 photographs of lunar rilles have been analyzed with a new technique that includes a finite Fourier analysis. Preliminary results suggest that it will be possible to classify rilles quantitatively by their planimetric shape. Shapes of possible terrestrial analogs for lunar rilles also can be compared to the shapes of lunar rilles by using this new technique. Preliminary results also suggest that the new technique may be useful for demonstrating structural control of shape of lunar rilles.


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    Title :

    Planimetric shapes of lunar rilles, part Q


    Contributors:
    Oberbeck, V. R. (author) / Aoyagi, M. (author) / Greeley, R. (author) / Lovas, M. (author)


    Publication date :

    1972-01-01


    Type of media :

    Miscellaneous


    Type of material :

    No indication


    Language :

    English


    Keywords :


    Temperature Distribution in Lunar Rilles

    A. S. ADORJAN | AIAA | 1971


    On the origin of lunar sinuous rilles

    Greeley, R. / Oberbeck, V. R. / Quaide, W. L. | NTRS | 1969


    Lunar rilles: A catalog and method of classification

    Oberbeck, V. R. / Greeley, R. / Morgan, R. B. et al. | NTRS | 1971


    Lunar Rilles a Catalog and Method of Classification

    V. R. Oberbeck / R. Greeley / R. B. Morgan et al. | NTIS | 1971


    The morphology, distribution, and origin of lunar sinuous rilles

    Lingenfelter, R. E. / Peale, S. J. / Schubert, G. | NTRS | 1970