The rationale and requirements for conducting accelerated life tests on electronic subsystems of spacecraft are presented. A method for applying data on the reliability and temperature sensitivity of the parts contained in a sybsystem to the selection of accelerated life test parameters is described. Additional considerations affecting the formulation of test requirements are identified, and practical limitations of accelerated aging are described.
Accelerated life testing of spacecraft subsystems
1972-11-01
Report
No indication
English
Accelerated Life Testing of Spacecraft Subsystems
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