The rationale and requirements for conducting accelerated life tests on electronic subsystems of spacecraft are presented. A method for applying data on the reliability and temperature sensitivity of the parts contained in a sybsystem to the selection of accelerated life test parameters is described. Additional considerations affecting the formulation of test requirements are identified, and practical limitations of accelerated aging are described.


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    Title :

    Accelerated life testing of spacecraft subsystems


    Contributors:
    Wiksten, D. (author) / Swanson, J. (author)

    Publication date :

    1972-11-01


    Type of media :

    Report


    Type of material :

    No indication


    Language :

    English


    Keywords :


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