Pilot scanning dwell times and control workload in simulated instrument approach, using eye-point-of- regard /EPR/ measurements


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    Title :

    Measurement and analysis of pilot scanning behavior during simulated instrument approaches


    Contributors:
    Klein, R. H. (author) / Weir, D. H. (author)

    Conference:

    AMERICAN INST. OF AERONAUTICS AND ASTRONAUTICS, GUIDANCE, CONTROL AND FLIGHT MECHANICS CONFERENCE ; 1970 ; SANTA BARBARA, CA


    Publication date :

    1970-08-01


    Type of media :

    Conference paper


    Type of material :

    No indication


    Language :

    English


    Keywords :