Through the use of a modification of the TRL (Through-Reflect-Line) method, integrated circuits contained within transitions have been successfully de-embedded. Two waveguide-to-suspended-substrate fixtures of different lengths were fabricated on a computer-controlled mill. Printed circuit waveguide probes were intentionally shortended to make them very reactive. Transmission and reflection measurement of a filter placed between the probes highlight the differences between measured and de-embedded results. This report reviews the theory behind TRL, explains the modifications used, and presents a computer program to de-embedded measurements from a Wiltron 360 network analyzer.
De-Embedding Millimeter-Wave Integrated Circuits with TRL
1991
31 pages
Report
No indication
English
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