The single event upset (SEU) phenomenon has continued to be of great interest to designers of spaceflight hardware. Although a great deal of ground testing has been and continues to be carried out, quantitative on-orbit measurements are very limited. Space measurements are a key part of the effort to ensure that the ground-based testing yields accurate predictions of on-orbit upset rates. Blake and Mandel have published data from two years of flight observations from a subsystem consisting of 384 Harris HM-6508 1K RAMs. This report is an update of that study; the results of 2560 days of observation are presented. A total of 234 SEUs were observed during 2560 days of observation. Thus, the average upset rate per day is (2.62 + or - 0.17) x .0000007 upsets/bit day. (fr)


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    Title :

    On-Orbit Observations of Single-Event Upset in Harris HM-6508 RAMSs (Random Access Memories): An Update


    Contributors:
    J. B. Blake (author) / R. Mandel (author)

    Publication date :

    1989


    Size :

    10 pages


    Type of media :

    Report


    Type of material :

    No indication


    Language :

    English




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