This bibliography contains citations concerning the reliability or fatigue life of electronic circuits subjected to temperature cycling in an environmental chamber. Applications in military aircraft and spacecraft electronic equipment are examined. Reliability testing devices are discussed relative to performance evaluations and utilization. (This updated bibliography contains 208 citations, 155 of which are new entries to the previous edition.)


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    Title :

    Integrated Circuits Reliability. June, 1974-June, 1982 (Citations from the International Aerospace Abstracts Data Base)


    Publication date :

    1982


    Size :

    199 pages


    Type of media :

    Report


    Type of material :

    No indication


    Language :

    English