We address the problem of camera motion and structure reconstruction from line correspondences across multiple views, from initialization to final bundle adjustment. One of the main difficulties when dealing with line features is their algebraic representation. First, we consider the triangulation problem. Based on Plucker coordinates to represent the lines, we propose a maximum likelihood algorithm, relying on linearising the Plucker constraint, and on a Plucker correction procedure to compute the closest Plucker coordinates to a given 6-vector. Second, we consider the bundle adjustment problem. Previous overparameterizations of 3D lines induce gauge freedoms and/or internal consistency constraints. We propose the orthonormal representation, which allows handy nonlinear optimization of 3D lines using the minimum 4 parameters, within an unconstrained nonlinear optimizer. We compare our algorithms to existing ones on simulated and real data.


    Access

    Check access

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Multiple-view structure and motion from line correspondences


    Contributors:
    Bartoli, (author) / Sturm, (author)


    Publication date :

    2003-01-01


    Size :

    401516 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



    Multiple-View Structure and Motion from Line Correspondences

    Bartoli, A. / Sturm, P. / IEEE | British Library Conference Proceedings | 2003


    Wide-Baseline Multiple-View Correspondences

    Ferrari, V. / Tuytelaars, T. / Van Gool, L. et al. | British Library Conference Proceedings | 2003


    Wide-baseline multiple-view correspondences

    Ferrari, V. / Tuytelaars, T. / Luc Val Gool, | IEEE | 2003


    Motion segmentation of multiple translating objects using line correspondences

    Fanhuai Shi, / Jianhua Wang, / Jing Zhang, et al. | IEEE | 2005


    Radon-based structure from motion without correspondences

    Makadia, A. / Geyer, C. / Sastry, S. et al. | IEEE | 2005