Fuzzy control is a practical alternative for a variety of challenging control applications, since it provides a convenient method for constructing nonlinear controllers via the use of heuristic information (1). In this work, we propose a novel technique to control the tip-sample distance in a scanning near field optical microscope (SNOM) using fuzzy control. The fuzzy controller design assumes only one input signal defined as the difference of the sampled signal (tuning fork-tip) and the reference signal, which are compared through designed software. This signal is used as the rule-base of the fuzzy logic controller. A basic data acquisition is used as interface to manipulate the fuzzy controller as feedback scheme in the positioning system (piezoelectric bimorph) for the shear force control. The approach curve of the shear-force measurement of the bimorph piezo was obtained using this scheme. In conclusion, this approach can be viewed as simple and reliable as feedback scheme based on fuzzy control for shear force control in a SNOM.


    Access

    Check access

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Feedback Scheme Based on Fuzzy Control for Shear Force Control




    Publication date :

    2012-11-01


    Size :

    317712 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



    Feedback scheme based on fuzzy control at nanometer scale

    Diego Vidal Escamilla Collí | BASE | 2010

    Free access

    Force-Feedback Cursor Control

    Hannaford, Blake / Szakaly, Zoltan F. | NTRS | 1989


    Mobile Robot Control Based on Virtual Impedance Force Feedback

    Sasaki, Masaru / Shibanoki, Taro / Tonooka, Hideyuki | IEEE | 2023


    Electric booster having force-feedback-control structure

    HWANG SE-RA / SHIM JAE-HUN / LEE JOUNG-HEE et al. | European Patent Office | 2020

    Free access

    ELECTRIC BOOSTER HAVING A FORCE FEEDBACK CONTROL

    European Patent Office | 2023

    Free access