This paper presents a novel feature-matching based approach for rigid object tracking. The proposed method models the tracking problem as discovering the affine transforms of object images between frames according to the extracted feature correspondences. False feature matches (outliers) are automatically detected and removed with a new SVM regression technique, where outliers are iteratively identified as support vectors with the gradually decreased insensitive margin /spl epsi/. This method, in addition to object tracking, can also be used for general feature-based epipolar constraint estimation, in which it can quickly detect outliers even if they make up, in theory, over 50% of the whole data. We have applied the proposed method to track real objects under cluttering backgrounds with very encouraging results.


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    Title :

    Tracking of object with SVM regression


    Contributors:
    Weiyu Zhu, (author) / Song Wang, (author) / Ruei-Sung Lin, (author) / Levinson, S. (author)


    Publication date :

    2001-01-01


    Size :

    1049402 byte





    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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