We provide an overview of developments in high-accuracy absolute optical metrology with emphasis on space-based applications. Specific work on the Modulation Sideband Technology for Absolute Ranging (MSTAR) sensor is described along with novel applications of the sensor.


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    Title :

    Absolute Optical Metrology: Nanometers to Kilometers


    Contributors:
    Dubovitsky, S. (author) / Lay, O.P. (author) / Peters, R.D. (author) / Liebe, C.C. (author)


    Publication date :

    2005-01-01


    Size :

    188049 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English