In the last decade, the accessibility of inexpensive and powerful computers has allowed true digital holography to be used for industrial inspection. This technique allows capturing a complex image of a scene (i.e. containing magnitude and phase), and reconstructing the phase and magnitude information. Digital holograms give a new dimension to texture analysis since the topology information can be used as an additional way to extract features. This new technique can be used to extend previous work on image segmentation of patterned wafers for defect detection. This paper presents a combination of features obtained from Gabor filters on different complex images. The combination enables to cope with the intensity variations occurring during the holography and provides final results which are independent from the selected training samples.


    Access

    Check access

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Classifier vote and Gabor filter banks for wafer segmentation


    Contributors:


    Publication date :

    2005-01-01


    Size :

    888944 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



    Classifier Vote and Gabor Filter Banks for Wafer Segmentation

    Bourgeat, P. / Meriaudeaua, F. | British Library Conference Proceedings | 2005


    Gabor Filter Based Multi-class Classifier for Scanned Document Images

    Ma, H. / Doermann, D. / Institute of Electrical and Electronics Engineers | British Library Conference Proceedings | 2003



    A customized Gabor filter for unsupervised color image segmentation

    Khan, J. F. / Adhami, R. R. / Bhuiyan, S. M. | British Library Online Contents | 2009


    A Gabor Feature Classifier for Face Recognition

    Liu, C. / Wechsler, H. / IEEE | British Library Conference Proceedings | 2001