Description of a microwave introscope combining multifrequency measurements and transversal scanning is presented. Longitudinal distance dependencies of reflectivity are obtained by synthesis from multifrequency data. The multifrequency measurements and synthesis is done in real-time. The apparatus carries out the measurements in free space. It is assembled using measuring modules of scalar reflectometer of series P2 (R2). Combination of data in longitudinal and transversal directions produces radio images of dielectric structures with embedded objects. A horn antenna as a probe is used. Some results of transversal resolution as function of distance and estimation of domain for correct determination of parameters structure are presented.


    Access

    Check access

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Microwave introscopy using multifrequency measurements & transversal scan


    Contributors:


    Publication date :

    2006-02-01


    Size :

    585835 byte




    Type of media :

    Article (Journal)


    Type of material :

    Electronic Resource


    Language :

    English




    Electroluminescent introscopy of solar cells

    Gercenshtain, M.I. | Online Contents | 1993


    Laser infrared introscopy of biological tissues [2969-124]

    Verenikina, N. M. / Levandovskiy, A. G. / Solovyev, O. L. et al. | British Library Conference Proceedings | 1996


    Introscopy of solids at Novosibirsk terahertz free electron laser

    Cherkassky, V. S. / Knyazev, B. A. / Ivanov, G. M. et al. | IEEE | 2006


    HUTRAD: Airborne Multifrequency Microwave Radiometer

    Hallikainen, M. / Kemppinen, M. / Pihlflyckt, J. et al. | British Library Conference Proceedings | 1998