Data are presented on room temperature dielectric properties of SiC wafers of various grades at millimeter wavelengths to explore their potential as an alternate material for gyrotron window applications. In addition, measurements are being performed over a range of frequencies and temperatures to understand the loss mechanism and results will be reported.


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    Title :

    Loss properties of SiC at millimeter wavelengths


    Contributors:
    Dutta, J.M. (author) / Yu, G. (author) / Jones, C.R. (author)


    Publication date :

    2005-01-01


    Size :

    300369 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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