There are few reports on the reliability of an electro-absorption modulator integrated with a distributed feedback laser (EA-DFB laser), although this is a very important photonic device in wavelength-division multiplexing (WDM) systems. We present the degradation modes in the EA-DFB laser, showing the lifetime is not determined by the degradation of the modulator but by that of the DFB laser, and then confirming the laser's stability under long-term operation. The devices we tested consisted of an EA modulator and a DFB laser that were integrated with butt-joint technology. The active layer of the DFB laser and the absorption layer of the modulator were composed of InGaAsP wells and InGaAsP barriers and were buried in Fe-doped InP.


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    Title :

    Reliability of an electro-absorption modulator integrated with a distributed feedback laser


    Contributors:
    Kamioka, H. (author) / Fukuda, M. (author) / Takeuchi, H. (author) / Iga, R. (author) / Kishi, K. (author) / Yasaka, H. (author) / Tsuda, H. (author) / Yokoyama, K. (author) / Tohmori, Y. (author) / Itaya, Y. (author)


    Publication date :

    1999-01-01


    Size :

    164819 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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