For the challenge of intricate the aging mechanism and the difficulty in measuring battery life, in-situ non-destructive diagnostic tests combined with Distribution of Relaxation Times (DRT) analysis capture the electrochemical process characteristics associated with time constants during battery cycle life. Subsequently, life prediction algorithm based on the Extreme Gradient Boosting (XGBoost) is developed. The prediction accuracy of dQ-dV, ECM (Equivalent Circuit Model), and DRT features is compared under dynamic conditions for two different batteries. The results indicate that the DRT analysis offers more precise mechanism characteristics than ECM and dQ-dV. The XGBoost-based estimation algorithm enhances the robustness of life prediction under dynamic conditions and improves the generalization across battery types.


    Access

    Check access

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Remaining Useful Life Prediction Based on Electrochemical Impedance Characteristic Distribution


    Contributors:
    He, Rong (author) / Guo, Bin (author)


    Publication date :

    2024-10-10


    Size :

    947630 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



    Prediction of Mining Railcar Remaining Useful Life

    Rahimdel, Mohammad Javad / Ghodrati, Behzad / Vahed, Amir Taghizadeh | Springer Verlag | 2019


    Prediction of Remaining Useful Life for Aero-Engines

    B, Rounak / J, Manikandan | IEEE | 2021


    Remaining Useful Life Prediction Based on LSTM with Peephole for PEMFC

    Wang, Kai / Cong, Ming / Yao, Naiyuan et al. | SAE Technical Papers | 2022


    Remaining Useful Life Prediction Based on LSTM with Peephole for PEMFC

    Ma, Tiancai / Liang, Yonghao / Cong, Ming et al. | British Library Conference Proceedings | 2022


    Remaining useful life prediction based on known usage data [5046-03]

    Kiddy, J. S. / International Society for Optical Engineering (SPIE) | British Library Conference Proceedings | 2003