The intent of this paper is to provide an approach for growth projections of Built-In-Test (BIT) False Alarm rates on a project where this metric is commonly tracked or required. The methodology for this approach is provided and then proved out through a hypothetical study. It provides an approach by which a layperson in the respective field can use field data to characterize the false alarm frequency of a complex system with diagnostic capabilities. And this can provide a projection for the false alarm frequency of the system once the false alarm corrections have been implemented. It leverages reliability growth concepts for false alarm projections. The fundamental premise of this approach is that false alarm mitigations are implemented through software upgrades.


    Access

    Check access

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    The Application of Reliability Growth Analysis for a Built- In-Test (BIT) False Alarm Projection


    Contributors:
    Barta, Joe (author) / Erlhoff, Ethan (author)


    Publication date :

    2024-03-02


    Size :

    1945341 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



    The Application of Neural Network Technology to Built-In Test False Alarm Filtering

    Press, R. / Aylstock, F. / Learoyd, C. et al. | British Library Conference Proceedings | 1993



    Empirical mode decomposition based reducing false alarm filter for built-in test signal

    Zhang, Miao / Shen, Yi / Li, Xin et al. | Tema Archive | 2011



    On false alarm mitigation

    Bock, J.R. / Brotherton, T. / Grabill, P. et al. | IEEE | 2006