The paper describes reflectance analysis of real images taken in an outdoor environment. In the past, the fundamental difficulties involved in analyzing outdoor images have prevented the use of traditional techniques for reflectance analysis such as shape from shading and photometric stereo. Those difficulties include: 1. multiple reflection components due to two light sources of different spectral and spatial distributions, namely the sunlight and the skylight, 2. ambiguity, in surface normal determination caused by the sun's restricted motion on the ecliptic, and 3. non-uniform surface albedo of object surfaces. In order to overcome those difficulties, we developed a reflectance model under solar illumination. Based on this model, we proposed solutions for each of these problems. We have successfully tested our algorithms using real color images taken both in a laboratory setup simulating sunlight, and in an outdoor environment under solar illumination.


    Access

    Check access

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Reflectance analysis under solar illumination


    Contributors:
    Sato, Y. (author) / Ikeuchi, K. (author)


    Publication date :

    1995-01-01


    Size :

    926675 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



    Reflectance Analysis Under Solar Illumination

    Sato, Y. / Ikeuchi, K. / IEEE et al. | British Library Conference Proceedings | 1995


    Estimating surface reflectance properties from images under unknown illumination [4299-23]

    Dror, R. O. / Adelson, E. H. / Willsky, A. S. et al. | British Library Conference Proceedings | 2001


    Using Frontier Points to Recover Shape, Reflectance and Illumination

    Vogiatzis, G. / Favaro, P. / Cipolla, R. et al. | British Library Conference Proceedings | 2005


    Using frontier points to recover shape, reflectance and illumination

    Vogiatzis, G. / Favaro, P. / Cipolla, R. | IEEE | 2005