The standard tracking metrics measure attributes such as position and velocity accuracy, covariance consistency, track completeness, spurious tracks, and redundant tracks. These standard metrics can be applied to a single target, and can be extended to a multiple-target scene by simply taking the per-target average. However, for quantifying tracking performance over a multiple-targets scene, standard per-target averages can be insufficient for characterizing scene-level performance. In this paper we present a family of pattern metrics which quantify how well the multiple-object track scene matches to truth at the scene level rather than at the per-target level. This paper will introduce and define three key pattern metrics: pattern accuracy, pattern consistency, and pattern containment. We will show that each of these pattern metrics provides a unique insight into system performance, and, to our knowledge, have not been previously published.


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    Title :

    Pattern metrics for groups of target tracks


    Contributors:


    Publication date :

    2018-03-01


    Size :

    875031 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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