We report a terahertz pulse apertureless near-field microscope (THz NFM) which combines THz time domain spectroscopy (THz-TDS) and atomic force microscopy (AFM) techniques. By scanning the probe over a GaAs/Au edge, it is found that the THz NFM has a lateral resolution of 80 nm.


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    Title :

    Terahertz Near-Field Microscope


    Contributors:
    Park, H. (author) / Kim, J. (author) / Kim, M. (author) / Han, H. (author) / Park, I. (author)


    Publication date :

    2006-09-01


    Size :

    1282805 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English




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