We report a terahertz pulse apertureless near-field microscope (THz NFM) which combines THz time domain spectroscopy (THz-TDS) and atomic force microscopy (AFM) techniques. By scanning the probe over a GaAs/Au edge, it is found that the THz NFM has a lateral resolution of 80 nm.
Terahertz Near-Field Microscope
2006-09-01
1282805 byte
Conference paper
Electronic Resource
English
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