Several years of study and actual testing have answered many of the previously controversial questions about the application of environmental overstress testing-to-failure as a useful tool for reliability evaluation. The answers included the fact that more than 65 percent of the failures occurring under overstress environments were duplicates of experienced operational failures. Improvements of 5 to 1 in reliability levels have resulted from application of results of overstress tests, which consumed less than 200 hours of actual test time. Overstress tests have also been used as a method of evaluating multiplesource designs. The first in a required series of indices has been derived, which may assist in the eventual use of overstress testing for reliability index measurement.
The Application of Overstress Testing-to-Failure to Airborne Electronics-A Status Report
IEEE Transactions on Aerospace and Electronic Systems ; AES-4 , 2 ; 142-148
1968-03-01
3160978 byte
Article (Journal)
Electronic Resource
English
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