We describe an atom detector with two-color optical near fields designed for deflection experiments. The sensitivity is estimated to be about 10% for both photoionization and resonant excitation schemes using a slit-type probe.
Near-field optical detection of atoms with high sensitivity and high spatial resolution
2001-01-01
156282 byte
Conference paper
Electronic Resource
English
Near-Field Optical Detection of Atoms with High Sensitivity and High Spatial Resolution
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