We describe an atom detector with two-color optical near fields designed for deflection experiments. The sensitivity is estimated to be about 10% for both photoionization and resonant excitation schemes using a slit-type probe.


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    Title :

    Near-field optical detection of atoms with high sensitivity and high spatial resolution


    Contributors:
    Ito, H. (author) / Totsuka, K. (author) / Kawamura, T. (author) / Yatsui, T. (author) / Ohtsu, M. (author)


    Publication date :

    2001-01-01


    Size :

    156282 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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