The performance of ground-based surveillance radars strongly depends on the distribution and spectral characteristics of ground clutter. To design signal processing algorithms that exploit the knowledge of clutter characteristics, a preliminary statistical analysis of ground-clutter data is necessary. We report the results of a statistical analysis of X-band ground-clutter data from the MIT Lincoln Laboratory Phase One program. Data non-Gaussianity of the in-phase and quadrature components was revealed, first by means of histogram and moments analysis, and then by means of a Gaussianity test based on cumulants of order higher than the second; to this purpose parametric autoregressive (AR) modeling of the clutter process was developed. The test is computationally attractive and has constant false alarm rate (CFAR). Incoherent analysis has also been carried out by checking the fitting to Rayleigh, Weibull, log-normal, and K-distribution models. Finally, a new modified Kolmogorov-Smirnoff (KS) goodness-of-fit test is proposed; this modified test guarantees good fitting in the distribution tails, which is of fundamental importance for a correct design of CFAR processors.


    Access

    Check access

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Statistical analyses of measured radar ground clutter data


    Contributors:
    Billingsley, J.B. (author) / Farina, A. (author) / Gini, F. (author) / Greco, M.V. (author) / Verrazzani, L. (author)


    Publication date :

    1999-04-01


    Size :

    1205616 byte




    Type of media :

    Article (Journal)


    Type of material :

    Electronic Resource


    Language :

    English





    Book Reviews - Low Angle Radar Ground Clutter

    Billingsley, J.Barrie | Online Contents | 2001


    Low-angle radar ground clutter [Book Review]

    Long, M.W. / Perry, B. | IEEE | 2001

    Free access

    Validation of windblown radar ground clutter spectral shape

    Greco, M. / Gini, F. / Farina, A. et al. | IEEE | 2001