In this paper, a measuring method of two-port network by a single six-port reflectometer is proposed . The four scattering parameters are divided into two groups so that they can be measured more easily. Calibration is convenient . The experimental results at Ka-band show that this method has higher accuracy.
Measurement of two-port networks by a single six-port reflectometer
1989-01-01
231558 byte
Conference paper
Electronic Resource
English
Three port tuned microwave reflectometer
Engineering Index Backfile | 1964
|A new four-port two-state reflectometer
IEEE | 1989
|Integrated Optical Six-Port Reflectometer in Silicon on Insulator
British Library Online Contents | 2009
|