The paper shows the strategies of choice of recovery methods of the RAM when, in space environment, they are affected by various SEE phenomena. The article considers various recovery methodologies, including two scrubbing methods (deterministic and probabilistic) and the criteria of choice according to the kind of mission in which the component is involved.


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    Title :

    Reliability andSEE mitigation in memories for space applications


    Contributors:


    Publication date :

    2016-06-01


    Size :

    5424646 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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