Polycrystalline CdS thin films, ranging in thickness from 30 to 200 nm, have been chemically deposited onto glass substrates using an ammonia-cadmium-thiourea reaction solution. Using proton-induced X-ray emission and atomic force microscopy, these film's elemental composition, thickness and microstructure have been examined. Analysis indicates that there is a distinct change from the continuous phase deposition to a particulate phase deposition and that these two different phases produce layers of CdS with different densities. Because of this change in density the point where the particulate CdS phase becomes the dominant deposition process can be identified. A mechanism is proposed to explain this difference in film densities.
Investigation of growth phases of chemical bath deposited CdS thin films
2002-01-01
335971 byte
Conference paper
Electronic Resource
English
Investigation of Growth Phases of Chemical Bath Deposited CdS Thin Films
British Library Conference Proceedings | 2002
|Properties of chemical bath deposited CdS thin films
Online Contents | 1995
|Physical properties of chemical bath deposited CdS thin films
Online Contents | 2004
|Preparation and Properties of CdS Thin Films Deposited by Chemical Bath Deposition
British Library Conference Proceedings | 2012
|Grain size dependence of the bandgap in chemical bath deposited CdS thin films
Online Contents | 2004
|