High quality one-dimensional waveguide arrays were fabricated and characterized. Second-harmonic generation in the array waveguides proved to be an ideal tool for a direct measurement of the discrete diffraction relation.


    Access

    Check access

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Direct measurement of the diffraction relation in waveguide arrays


    Contributors:
    Schiek, R. (author) / Iwanow, R. (author) / Stegeman, G.I. (author) / Pertsch, T. (author) / Lederer, F. (author) / Yoohong Min, (author) / Sohler, W. (author)


    Publication date :

    2004-01-01


    Size :

    116376 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



    Direct Measurement of the Diffraction Relation in Waveguide Arrays

    Lasers and Electro-optics Society (Institute of Electrical and Electronics Engineers) | British Library Conference Proceedings | 2004


    Diffraction management in 2D waveguide arrays

    Aqiang Guo, / Yongan Tang, / Black, W. et al. | IEEE | 2004


    Two-dimensional discrete diffraction in silica waveguide arrays

    Burghoff, J. / Will, M. / Nolte, S. et al. | IEEE | 2004


    Bent Configurations of Waveguide Slot Arrays

    Zabihi, Roshanak / Razmhosseini, Maryam / Vaughan, Rodney G. | IEEE | 2019


    Self-localization in nonlinear waveguide arrays

    Aitchison, J. S. / Morandotti, R. / Eisenberg, H. et al. | British Library Conference Proceedings | 1998