Using thermal profiling of semiconductor optical amplifier we measure the location of gain saturation in the device. This method is used to determine the light intensity and gain in the SOA using only surface measurements.


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    Title :

    Thermal profiling of gain saturation in semiconductor optical amplifiers


    Contributors:
    Luerssen, D. (author) / Hudgings, J. (author) / Ram, R.J. (author) / Clausen, E. (author) / Hohl-AbiChedid, A. (author)


    Publication date :

    2004-01-01


    Size :

    171078 byte



    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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