We have observed THz emission from single- and double-layer HgCdTe (MCT) films epitaxially grown on CdZnTe substrates photoexcited by femtosecond laser pulses. The emitted THz radiation was electro-optically detected in reflection-mode at the 45° specular direction. There is a dramatic variation in the emitted signal level from the double-layer samples, whereas the signal level from the single-layer samples shows a relatively constant variation with composition and/or geometry. For the double-layer samples, the highest peak amplitude recorded is 1/5 of that of an InAs emitter, analogous to double that of a standard ZnTe emitter, and shows promise for further enhancement.


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    Title :

    THz Emission from Mercury Cadmium Telluride Films Grown on Cadmium Zinc Telluride Substrates


    Contributors:
    Mendis, R. (author) / Smith, M. L. (author) / Vickers, R. E. M. (author) / Lewis, R. A. (author) / Zhang, C. (author)


    Publication date :

    2006-09-01


    Size :

    977535 byte




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English



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