The JERTOC concept was formulated as one approach to help realize the generic better, faster, cheaper, safer, and smarter criteria applied to test and evaluation (T&E). The JERTOC concept involves testing and evaluating an advanced air vehicle flight test methodology which consist of integrating and validating specific technology programs available in the 21st century. These technology programs focus on aircraft and engine simulation modeling, design, test planning, and test reporting options to better support acquisition, testing and training in an integrated environment. An initial goal of this program concept is to develop the capability to do analytically in one month what might currently take more than two years of actual air vehicle flight testing. A final goal includes using the capability of a high performance computing (HPC) center to analytically run a helicopter air vehicle test program in one 24 hour period. This advanced capability would not be used to replace actual flight testing, but would be used as a flight test planning tool to help predict flight results, identify potential flight limitations, and improve flight test safety. The initial focus of the JERTOC concept will be on air vehicle model structure validation and on applying collaborative network options to enhance rotorcraft test and evaluation.


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    Title :

    Joint enhanced rotorcraft test and operational capability (JERTOC) for the 21st century


    Contributors:
    Carico, D. (author) / Blemel, K. (author)


    Publication date :

    2000-01-01


    Size :

    804232 byte





    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English





    Joint Enhanced Rotorcraft Test and Operational Capability (JERTOC)

    Carico, D. / Slade, C. / Society of Flight Test Engineers | British Library Conference Proceedings | 1999


    Joint Enhanced Rotorcraft Test and Operational Capability (JERTOC) for the 21^s^t Century

    Carico, D. / Blemel, K. / Institute of Electrical and Electronics Engineers | British Library Conference Proceedings | 2000