In a high-speed measurement mode, a high-voltage measurement mode (V0 measurement) is omitted and only a negative-pole side ground fault resistor voltage measurement mode (VC1n measurement) and a positive-pole side ground fault resistor voltage measurement mode (VC1p measurement) are performed. In the negative-pole side ground fault resistor voltage measurement mode (VC1n measurement) and the positive-pole side ground fault resistor voltage measurement mode (VC1p measurement), the charging time for the flying capacitor is set to a second predetermined time period that is shorter than a first predetermined time period, which is different from basic operations in a normal measurement mode.
Insulation state detecting device
2017-11-14
Patent
Electronic Resource
English
INSULATION ABNORMALITY DETECTING DEVICE AND INSULATION ABNORMALITY DETECTING METHOD
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