The present invention relates to an apparatus for inspecting a door short-circuit of an elevator and an inspection method thereof, wherein the apparatus can prevent a damage to other parts or a safety risk during an inspection process while providing convenience of inspection by inspecting a door short-circuit state by a simple structure and method. According to the present invention, for the apparatus for inspecting a door short-circuit of an elevator, which can inspect a door switch (11) installed on a door (10) of an elevator car or an elevator platform, and the inspection method thereof, the apparatus comprise: a rod-shaped handle (31) extending to a certain length; a rotational shaft (33) coupled to a front end of the handle (31) and a rotational holder (32) coupled to the rotational shaft (33) to adjust an angle; and short switchs (40, 50) detachably coupled to the rotational holder (32) and provided with contact tips (42, 52) to short-circuit the door switch (11).

    본 발명은 간단한 구조와 방법에 의한 도어단락 상태를 검사하여 검사상의 편리함을 제공함과 동시에 검사과정에서의 다른 부품의 손상이나 안전상의 위험을 방지할 수 있는 엘리베이터의 도어단락 검사장치 및 검사방법에 관한 것이다. 본 발명에 따르면, 엘리베이터의 승강카나 승강장의 도어(10) 상에 설치된 도어스위치(11)를 점검할 수 있도록 된 도어단락 검사장치 및 검사방법에 있어서; 일정 길이로 연장되는 봉형태로 된 손잡이(31)와; 상기 손잡이(31)의 선단측에 결합된 회동축(33) 및 상기 회동축(33) 상에 결합되어 각도조절 가능하도록 된 회동홀더(32)와; 상기 회동홀더(32) 상에 착탈 가능하게 결합되어 도어스위치(11)를 단락시키도록 접점팁(42,52)이 구비된 단락기(40,50)로 구성된 엘리베이터의 도어단락 검사장치 및 검사방법이 제공된다.


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    Title :

    Door contact short inspector and method of an elevator


    Additional title:

    엘리베이터의 도어단락 검사장치 및 검사방법


    Contributors:
    KIM KWANG HUI (author) / CHOI SUK JIN (author) / KIM SANG JAE (author) / CHA JUN HYUCK (author) / SHIN SE HO (author) / SHIN BAN SEOK (author) / YUN JI GANG (author) / LEE JONG HOON (author) / KIM CHANG WOOK (author)

    Publication date :

    2022-07-22


    Type of media :

    Patent


    Type of material :

    Electronic Resource


    Language :

    Korean


    Classification :

    IPC:    B66B Aufzüge , ELEVATORS



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