To provide a track irregularity measuring device which has a simple structure and an improved measurement accuracy.SOLUTION: This disclosure relates with a device measuring an irregularity of a track with two rails. The track irregularity measuring device comprises a measuring part traveling along at least a rail of the two rails, an inertia measurement device which is arranged in the measuring part and measures an angular velocity and an acceleration and a processor processing an output of the inertia measurement device. The processor, while calibrating an inclination of the inertia measurement device that is not caused by a condition of at least a rail, by the use of the inertia measurement device output, calculates the condition of at least a rail.SELECTED DRAWING: Figure 1

    【課題】構造を簡略化しつつ、測定精度を高められる軌道狂い測定装置を提供する。【解決手段】本開示は、2つのレールを有する軌道の狂い測定装置である。軌道狂い測定装置は、2つのレールのうち、少なくとも1つのレールに沿って走行する測定部と、測定部に配置された角速度及び加速度を測定する慣性計測装置と、慣性計測装置の出力を処理する処理装置と、を備える。処理装置は、慣性計測装置の出力を用いて、少なくとも1つのレールの状態に起因しない慣性計測装置の傾きを補正しつつ、少なくとも1つのレールの状態を算出する。【選択図】図1


    Access

    Download


    Export, share and cite



    Title :

    TRACK IRREGULARITY MEASURING DEVICE


    Additional title:

    軌道狂い測定装置


    Contributors:

    Publication date :

    2020-10-22


    Type of media :

    Patent


    Type of material :

    Electronic Resource


    Language :

    Japanese


    Classification :

    IPC:    B61K Andere Hilfseinrichtungen für Eisenbahnen , OTHER AUXILIARY EQUIPMENT FOR RAILWAYS / E01B PERMANENT WAY , Gleisoberbau / G01B MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS , Messen der Länge, der Dicke oder ähnlicher linearer Abmessungen




    Track irregularity measuring device and method based on laser contour scanning

    GUO WEI / YU ZHIWU / JIANG LIZHONG et al. | European Patent Office | 2021

    Free access

    On-bridge track irregularity evaluation method and device

    XU JINHUI / XU CHENXIAO / FENG QINGSONG et al. | European Patent Office | 2021

    Free access

    Track short wave irregularity spectrum fitting method and device

    YANG FEI / SUN XIANFU / WEI ZILONG et al. | European Patent Office | 2022

    Free access