To provide a temperature abnormality detection system capable of precisely detecting temperature abnormality of underfloor equipment.SOLUTION: The temperature abnormality detection system includes a measurement unit for measuring the temperature of underfloor equipment at a plurality of points and a processing unit for determining the temperature abnormality on the basis of a first temperature T1, a second temperature T2, and a third temperature T3 measured by the measurement unit. The processing unit determines the temperature abnormality by using a plurality of predetermined thresholds when any one of the following conditions is satisfied: (A) T1>A0, T2>A0, or T3>A0; (B) T1>A1, (T2-T1>A4 or T2-T1<0), T2>A2 and T3>A3; (C) T1>A1, T2-T1>A4, and T3>A3; (D) T1>A1, T2-T1>A4, and (T3-T2>A5 or T3-T1>A6); and (E) T1>A1, T2-T1<0, and (T3-T2>A7 or T3-T1>A8) (note that, A1
【課題】床下機器の温度異常を精度よく検知できる温度異常検出システムを提供する。【解決手段】本開示は、複数の地点において床下機器の温度を測定する測定部と、測定部が測定した第1温度T1と、第2温度T2と、第3温度T3とに基づいて温度異常を判定する処理部とを備える温度異常検出システムである。処理部は、予め定められた複数の閾値を用い、下記条件のいずれかが満たされる場合に、温度異常があると判定する。(A)T1>A0又はT2>A0又はT3>A0、(B)T1>A1かつ(T2−T1>A4又はT2−T1<0)かつT2>A2かつT3>A3、(C)T1>A1かつT2−T1>A4かつT3>A3、(D)T1>A1かつT2−T1>A4かつ(T3−T2>A5又はT3−T1>A6)、(E)T1>A1かつT2−T1<0かつ(T3−T2>A7又はT3−T1>A8)(なお、A1<A0、A2<A0、A3<A0である。)【選択図】図5
TEMPERATURE ABNORMALITY DETECTION SYSTEM AND TEMPERATURE ABNORMALITY DETECTION METHOD
温度異常検出システム及び温度異常検出方法
2020-02-13
Patent
Electronic Resource
Japanese
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