To enable detection of abnormality in lighting and the like of a target vehicle without obtaining information from another device.SOLUTION: An abnormality detection apparatus includes: first obtainment means for obtaining imaging data picking up a target vehicle traveling on a road; first recognition means for recognizing a lighting state of a lighting and the like of the target vehicle on the basis of the imaging data; second recognition means for recognizing whether the lighting and the like is necessary to be lit; and detection means for detecting whether the lighting and the like are normal on the basis of the lighting state and necessity of being lit.SELECTED DRAWING: Figure 1

    【課題】他の装置から情報を取得しなくても対象車両の灯火類の異常を検出可能とする。【解決手段】本発明の異常検出装置は、道路上を走行する対象車両を撮像した撮像データを取得する第一取得手段と、前記撮像データに基づいて、前記対象車両の灯火類の点灯状態を認識する第一認識手段と、前記撮像データに基づいて、前記灯火類の点灯要否を認識する第二認識手段と、前記点灯状態および前記点灯要否に基づいて、前記灯火類が正常であるか異常であるかを検出する検出手段と、を有する。【選択図】図1


    Access

    Download


    Export, share and cite



    Title :

    ABNORMALITY DETECTION APPARATUS, ABNORMALITY DETECTION METHOD, AND ABNORMALITY DETECTION SYSTEM


    Additional title:

    異常検出装置、異常検出方法、および異常検出システム


    Contributors:

    Publication date :

    2019-03-22


    Type of media :

    Patent


    Type of material :

    Electronic Resource


    Language :

    Japanese


    Classification :

    IPC:    B60Q ARRANGEMENT OF SIGNALLING OR LIGHTING DEVICES, THE MOUNTING OR SUPPORTING THEREOF OR CIRCUITS THEREFOR, FOR VEHICLES IN GENERAL , Anordnung von Signal- oder Beleuchtungsvorrichtungen, deren Einbau oder Halterung oder deren Schaltkreise bei Fahrzeugen allgemein / G08G Anlagen zur Steuerung, Regelung oder Überwachung des Verkehrs , TRAFFIC CONTROL SYSTEMS



    ABNORMALITY DETECTION METHOD, ABNORMALITY DETECTION APPARATUS, AND ABNORMALITY DETECTION SYSTEM

    MORI MAKI / MUTO KENJI | European Patent Office | 2020

    Free access

    Abnormality detection apparatus, abnormality detection method, and abnormality detection system

    INABA CHIHIRO / ENDO TOSHIKI / ADACHI EISUKE et al. | European Patent Office | 2022

    Free access


    ABNORMALITY DETECTION APPARATUS, ABNORMALITY DETECTION METHOD, AND ABNORMALITY DETECTION SYSTEM

    INABA CHIHIRO / ENDO TOSHIKI / ADACHI EISUKE et al. | European Patent Office | 2019

    Free access

    Abnormality detection method, abnormality detection apparatus, and abnormality detection system

    MORI MASATAKA / MUTO KENJI | European Patent Office | 2023

    Free access