PROBLEM TO BE SOLVED: To identify whether there is a failure in a semiconductor switch element with high reliability and at a low cost.SOLUTION: When an intelligent power switch 10 incorporating a semiconductor switch element 11 and a circuit 12 having a current sense function is used, a control section, such as a microcomputer 20, identifies whether there is a failure in a semiconductor short circuit or the like as a result of monitoring a voltage of a sense signal and comparing it with a threshold according to the level of a binary signal applied to a control input terminal 10c. The result is output by comprehensively considering results detected with the level of the binary signal in two states. Firstly, the sense signal is detected with the binary signal in an off state, and then the sense signal is detected with the binary signal in an on state. After the binary signal is set on, the detection is performed after a predetermined delay time.

    【課題】半導体スイッチ素子の故障の有無を高い信頼度で、しかも低コストで識別すること。【解決手段】半導体のスイッチ素子11及び電流センス機能を備える回路12を内蔵したインテリジェント・パワー・スイッチ10を利用する場合に、マイクロコンピュータ20等の制御部が、センス信号の電圧を監視し、制御入力端子10cに印加される二値信号の高低に応じた閾値と比較した結果により、半導体ショート等の故障の有無を識別する。二値信号の高低の両方の状態で検出した結果を総合的に判断して結果を出力する。最初に二値信号がオフの状態でセンス信号を検出し、次に二値信号がオンの状態でセンス信号を検出する。二値信号がオンになった後、所定の遅延時間だけ待機してから検出する。【選択図】図1


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    Title :

    SEMICONDUCTOR ABNORMALITY DETECTION CIRCUIT


    Additional title:

    半導体異常検出回路


    Contributors:

    Publication date :

    2015-06-22


    Type of media :

    Patent


    Type of material :

    Electronic Resource


    Language :

    Japanese


    Classification :

    IPC:    H03K PULSE TECHNIQUE , Impulstechnik / B60R Fahrzeuge, Fahrzeugausstattung oder Fahrzeugteile, soweit nicht anderweitig vorgesehen , VEHICLES, VEHICLE FITTINGS, OR VEHICLE PARTS, NOT OTHERWISE PROVIDED FOR



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