Described herein is a projective optical metrology system including: a light target (2) formed by a first number of light sources (4a-4c) having a pre-set spatial arrangement; and an optical unit (6) including an optoelectronic image sensor (10), which receives a light signal (R 1 , R 2 ) coming from the light target (2) and defines two different optical paths for the light signal towards the optoelectronic image sensor (10). The two optical paths are such that the light signal forms on the optoelectronic image sensor at most an image (I 1 ;I 2 ) of the light target that can be processed for determining at least one quantity indicating the mutual arrangement between the light target and the optical unit.


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    Title :

    Coarse and fine projective optical metrology system


    Additional title:

    Grobes und feines projektives, optisches Metrologiesystem
    Système de métrologie optique projéctif gros et fin


    Contributors:

    Publication date :

    2016-02-10


    Type of media :

    Patent


    Type of material :

    Electronic Resource


    Language :

    English


    Classification :

    IPC:    B64G Raumfahrt , COSMONAUTICS / G01C Messen von Entfernungen, Höhen, Neigungen oder Richtungen , MEASURING DISTANCES, LEVELS OR BEARINGS / G01S RADIO DIRECTION-FINDING , Funkpeilung




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