Systems and methods for characterizing a response of a structure under test to an applied excitation force using a test fixture are disclosed. The fixture is selectively coupleable to a structure under test and is configured to hold the structure under test in a known position and a known orientation relative to the fixture. A plurality of excitation devices and response sensors are coupled to the fixture. An excitation force applied to the fixture by the excitation device is transmitted by the fixture to the structure under test, and each response sensor measures a dynamic response indicative of a response of the structure under test and the fixture to the applied excitation force. A controller receives the response sensor data and applies a mathematical coordinate transformation to project forces and moments corresponding to the applied excitation and the measured dynamic response to a target point of the structure under test, and calculates a system response function based at least in part on the projection.
公开用于使用测试固定装置表征被测试结构对所施加的激励力的响应的系统和方法。该固定装置可选择性地联接到被测试结构,并且被配置成以相对于该固定装置的已知位置和已知取向保持被测试结构。多个激励设备和响应传感器联接到该固定装置。由激励设备施加到固定装置的激励力由该固定装置传送到被测试结构,并且每一响应传感器均测量指示被测试结构和固定装置对所施加的激励力的响应的动态响应。控制器接收响应传感器数据,并且应用数学坐标变换以将对应于所施加的激励的力和力矩以及所测量的动态响应投影到被测试结构的目标点,并且至少部分基于该投影计算系统响应函数。
Multi-degree-of-freedom impedance fixing device for automatic frequency response function measurement
用于自动频率响应函数测量的多自由度阻抗固定装置
2024-11-08
Patent
Electronic Resource
Chinese
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