The invention relates to a method and system for optimization of a secondary platform linear array CCD measured inclination angle based on Kalman filtering, and aims to to solve the problem of low accuracy of measurement results in existing measurement of platform inclination angle by linear array CCD. The method is realized through the technical scheme including: step 1, letting a high-speed rotary motor drive a semiconductor laser unit to rotate so as to obtain the height data of light points on linear array CCD photosensitive devices; step 2, selecting the height data of light points on adjacent three linear array CCD photosensitive devices to determine a plane and denoting the plane as ABC, and working out the normal direction vector of the plane according to the coordinates of the three points, and then calculating the angle theta; and step 3, conducting recursive correction on the angle theta by Kalman filtering to obtain the actual inclination angle at the moment t. The method provided by the invention can be applied to the field of secondary platform inclination angle measurement.
Method for optimization of secondary platform linear array CCD measured inclination angle based on Kalman filtering
2015-12-23
Patent
Electronic Resource
English
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