Paper presents parts failure rates which resulted from operational reliability program conducted on Central Air Data Computer and Vertical Scale Systems of F-105D and F-106A and B aircraft integrated instrument system; rates, in general, compare favorably with those generated as result of other programs; however, semiconductor rates are significantly lower than other industry rates; evidence presented indicates that this is primarily due to 100% incoming inspection procedures employed by Eclipse-Pioneer Div on all semiconductors.


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    Title :

    Parts failure rates resulting from operational reliability program


    Additional title:

    SAE -- Paper


    Contributors:

    Conference:

    SAE Meeting ; 1963 Reliability



    Publication date :

    1963


    Size :

    6 pages


    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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