Paper presents parts failure rates which resulted from operational reliability program conducted on Central Air Data Computer and Vertical Scale Systems of F-105D and F-106A and B aircraft integrated instrument system; rates, in general, compare favorably with those generated as result of other programs; however, semiconductor rates are significantly lower than other industry rates; evidence presented indicates that this is primarily due to 100% incoming inspection procedures employed by Eclipse-Pioneer Div on all semiconductors.
Parts failure rates resulting from operational reliability program
SAE -- Paper
SAE Meeting ; 1963 Reliability
1963
6 pages
Conference paper
English
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Parts Failure Rates Resulting from an Operational Reliability Program
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