Program carried out by Avionics Div, Bureau of Naval Weapons, U S Navy, to achieve maximum improvement in electronic effectiveness through advanced techniques (MIEETAT) such as application of microcircuit techniques, produced by various silicon (planar epitaxial) transistor technologies, for improved reliability, lower lifetime costs, smaller sizes, lower weight, and design costs; use of digital data processing, visual fault location, modular construction, design redundancy, reliability and maintainability testing; 4 phases of program; progress made; development and features of versatile avionics test systems, (VAST).


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    Title :

    Reliability and maintainability barrier


    Additional title:

    SAE -- Paper


    Contributors:

    Conference:

    SAE Meeting ; 1964 Electronic equipment



    Publication date :

    1964


    Size :

    5 pages


    Type of media :

    Conference paper


    Type of material :

    Print


    Language :

    English




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