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    Title :

    Failure mechanism analysis and correlation to process parameters:a prerequisite to microelectronics yield and reliability enhancement


    Additional title:

    Analyse mechanischer Fehler und Korrelation zu Prozessparametern:Voraussetzung fuer Anwendung von Mikroelektronik und zur Erhoehung der Zuverlaessigkeit.


    Contributors:

    Publication date :

    1990


    Size :

    16 pages


    Remarks:

    FISITA-Paper;905209;1990;23.FISITA Congress Turin (May 1990), Proc.Vol. 2


    Type of media :

    Miscellaneous


    Type of material :

    Print


    Language :

    English



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