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    Title :

    Model Results on the Radiation-Hardness of Submicron Electronics in Aeronautical Systems


    Contributors:

    Conference:

    U.S. Air Force T&E Days 2010 ; 2010 ; Nashville , Tennessee



    Publication date :

    2010-01-01




    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English




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