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    Title :

    Integrated test program for a weapon system


    Contributors:
    CHEN, O. (author)

    Conference:

    Test Effectiveness in the 70's Conference ; 1970 ; Palo Alto , CA , U.S.A.



    Publication date :

    1970-01-01



    Type of media :

    Conference paper


    Type of material :

    Electronic Resource


    Language :

    English