A moving line-source laser beam was used to scan the entire surface of a rectangular plate, pursuant to locating defects. The laser generates a point beam of laser energy, which is transformed into a line-heating source using sheet-forming optical components. The heat source is then scanned across the sample by placing the sample in a vertical position on a moving servo table, which moves horizontally at a prescribed speed. A relatively small overall temperature rise of 10° is desired to allow the heat transfer to be modeled mathematically assuming constant thermal properties. A thermal camera was employed for recording the temperature distribution on the nonheated side of the sample. Once a mathematical model or other smoothing technique is fitted to the experimental data, the calculated temperature is subtracted from the measured temperature, and a residual temperature field is created. Additional features of this research include the use of simple spline fits, Bayesian techniques, and the mollification method. The results are provided, which allow for a comparison of the effectiveness of each technique.


    Access

    Check access

    Check availability in my library

    Order at Subito €


    Export, share and cite



    Title :

    Detecting Material Defects Using a Scanning Laser Beam


    Contributors:

    Published in:

    Publication date :

    2018-10-12


    Size :

    6 pages




    Type of media :

    Article (Journal)


    Type of material :

    Electronic Resource


    Language :

    English




    APPARATUS FOR NOTIFYING WALK SIGNAL USING LASER BEAM SCANNING

    YEOM SANG HOON | European Patent Office | 2019

    Free access

    METHOD, SYSTEM AND MATERIAL FOR DETECTING OBJECTS OF HIGH INTEREST WITH LASER SCANNING SYSTEMS

    ACETI JOHN G / BERNSTEIN JONATHAN / GARRISON DENNIS | European Patent Office | 2019

    Free access

    Method, system and material for detecting objects of high interest with laser scanning systems

    ACETI JOHN G / BERNSTEIN JONATHAN / GARRISON DENNIS | European Patent Office | 2022

    Free access

    Detecting tiny defects

    Emerald Group Publishing | 2001


    The Localization of the Defects in Semiconductor Devices Using a New Laser Scanning

    IEEE; Lasers and Electro-Optics Society | British Library Conference Proceedings | 1993