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    Title :

    Quality first : measuring a safety-critical embedded software development process


    Contributors:


    Publication date :

    1999


    Size :

    24 S


    Remarks:

    graph. Darst
    This report is based on an presentation held at the VTT Symposium, Oulu, Finland, June 22-24, 1998
    Digital preservation by Technische Informationsbibliothek (TIB) / Leibniz-Informationszentrum Technik und Naturwissenschaften und Universitätsbibliothek


    Type of media :

    Report


    Type of material :

    Print


    Language :

    English





    Efficient development of safety-critical software

    Camus, J.-L. | IET Digital Library Archive | 2003


    Embedded Software Quality

    Karcher, M. | Tema Archive | 2002