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    Title :

    Machine vision systems for inspection and metrology VII : 4 - 5 November 1998, Boston, Massachusetts


    Contributors:

    Conference:

    Conference ; 1998 ; Boston, Mass. Conference (Boston, Mass.) : 1998.11.04-05



    Publication date :

    1998


    Size :

    XI, 386 S


    Remarks:

    Digital preservation by Technische Informationsbibliothek (TIB) / Leibniz-Informationszentrum Technik und Naturwissenschaften und Universitätsbibliothek



    Type of media :

    Conference Proceedings


    Type of material :

    Print


    Language :

    English



    Classification :

    DDC:    670.42/5