Nowadays using SRAM based FPGAs in space missions is increasingly considered due to their flexibility and reprogrammability. A challenge is the devices sensitivity to radiation effects that increased with modern architectures due to smaller CMOS structures. This work proposes fault tolerance methodologies, that are based on a fine grain view to modern reconfigurable architectures. The focus is on SEU mitigation challenges in SRAM based FPGAs which can result in crucial situations


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    Title :

    Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space


    Contributors:


    Publication date :

    2013


    Size :

    1 Online-Ressource (IX, 146 p.)



    Type of media :

    Book


    Type of material :

    Electronic Resource


    Language :

    English




    Using Fine Grain Approaches for highly reliable Design of FPGA-based Systems in Space

    Niknahad, Mahtab | GWLB - Gottfried Wilhelm Leibniz Bibliothek | 2013

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